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Trilateral optical powermeter comparison between NIST, NMIJ/AIST, and METAS
Vayshenker, I., Lehman, J. H., Livigni, D. J., Li, X., Amemiya, K., Fukuda, D., Mukai, S., Kimura, S., Endo, M., Morel, J.Volume:
46
Year:
2007
Language:
english
Journal:
ao/46/5/ao-46-5-643.pdf
DOI:
10.1364/AO.46.000643
File:
PDF, 619 KB
english, 2007