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Tracking the emergence of defect in light emitting semiconductor diodes with two-photon excitation microscopy and spectral microthermography
Bautista, Godofredo, Blanca, Carlo Mar, Saloma, CaesarVolume:
46
Year:
2007
Language:
english
Journal:
ao/46/6/ao-46-6-855.pdf
DOI:
10.1364/AO.46.000855
File:
PDF, 939 KB
english, 2007