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Temperature-dependent refractive index measurements of wafer-shaped InAs and InSb
Gillen, Glen D., DiRocco, Chris, Powers, Peter, Guha, ShekharVolume:
47
Year:
2008
Language:
english
Journal:
ao/47/2/ao-47-2-164.pdf
DOI:
10.1364/AO.47.000164
File:
PDF, 154 KB
english, 2008