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Continuous wave terahertz spectrometer as a noncontact thickness measuring device
Wilk, Rafał, Breitfeld, Falk, Mikulics, Martin, Koch, MartinVolume:
47
Year:
2008
Language:
english
Journal:
ao/47/16/ao-47-16-3023.pdf
DOI:
10.1364/AO.47.003023
File:
PDF, 2.13 MB
english, 2008