High resolution Talbot self-imaging applied to structural...

Applied Optics 2008 Vol. 47; Iss. 26

High resolution Talbot self-imaging applied to structural characterization of self-assembled monolayers of microspheres

Garcia-Sucerquia, J., Alvarez-Palacio, D. C., Kreuzer, H. J.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
47
Year:
2008
Language:
english
Journal:
ao/47/26/ao-47-26-4723.pdf
DOI:
10.1364/AO.47.004723
File:
PDF, 8.61 MB
english, 2008
Conversion to is in progress
Conversion to is failed