![](/img/cover-not-exists.png)
Linear optical characterization of transparent thin films by the Z-scan technique
Boudebs, Georges, Fedus, KamilVolume:
48
Year:
2009
Language:
english
Journal:
ao/48/21/ao-48-21-4124.pdf
DOI:
10.1364/AO.48.004124
File:
PDF, 598 KB
english, 2009