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Instrument for close-to-process light scatter measurements of thin film coatings and substrates
von Finck, Alexander, Hauptvogel, Matthias, Duparré, AngelaVolume:
50
Year:
2011
Language:
english
Pages:
1
Journal:
ao/50/9/ao-50-9-C321.pdf
DOI:
10.1364/AO.50.00C321
File:
PDF, 756 KB
english, 2011