Slightly off-axis interferometry for microscopy with second...

Applied Optics 2011 Vol. 50; Iss. 17

Slightly off-axis interferometry for microscopy with second wavelength assistance

Han, Junhe, Gao, Peng, Yao, Baoli, Gu, Yuzong, Huang, Mingju
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Volume:
50
Year:
2011
Language:
english
Journal:
ao/50/17/ao-50-17-2793.pdf
DOI:
10.1364/AO.50.002793
File:
PDF, 644 KB
english, 2011
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