Depth resolution and multiexponential lifetime analyses of...

Applied Optics 2011 Vol. 50; Iss. 21

Depth resolution and multiexponential lifetime analyses of reflectance-based time-domain fluorescence data

Tichauer, Kenneth M., Migueis, Mark, Leblond, Frederic, Elliott, Jonathan T., Diop, Mamadou, St. Lawrence, Keith, Lee, Ting-Yim
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Volume:
50
Year:
2011
Language:
english
Journal:
ao/50/21/ao-50-21-3962.pdf
DOI:
10.1364/AO.50.003962
File:
PDF, 780 KB
english, 2011
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