Reduction in Raman Intensities of Si+O− Defect Bands in...

Applied Spectroscopy 1978 Vol. 32; Iss. 6

Reduction in Raman Intensities of Si+O− Defect Bands in Quartz Glass by Thermal Treatment

Aussenegg, F. R., Lippitsch, M. E., Schiefer, E., Deserno, U., Rosenberger, D.
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Volume:
32
Year:
1978
Language:
english
Pages:
2
Journal:
as/32/6/as-32-6-587.pdf
DOI:
10.1366/000370278774330757
File:
PDF, 221 KB
english, 1978
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