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Surface-Enhanced Raman Scattering and Atomic Force Microscopy of Brass Electrodes in Sulfuric Acid Solution Containing Benzotriazole and Chloride Ion
Rubim, Joel C., Kim, Jae-Ho, Henderson, Eric, Cotton, Therese M.Volume:
47
Year:
1993
Language:
english
Pages:
5
Journal:
as/47/1/as-47-1-80.pdf
DOI:
10.1366/0003702934048541
File:
PDF, 801 KB
english, 1993