Use of Normalized Relative Line Intensities for Qualitative and Semi-Quantitative Analysis in Inductively Coupled Plasma Atomic Emission Spectrometry Using a Custom Segmented-Array Charge-Coupled Device Detector. Part I: Principle and Feasibility
Soudier, Luc, Mermet, Jean-MichelVolume:
49
Year:
1995
Language:
english
Pages:
7
Journal:
as/49/10/as-49-10-1478.pdf
DOI:
10.1366/0003702953965623
File:
PDF, 693 KB
english, 1995