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Emission-depth Dependence of the Signal Photoelectron Energy Spectrum
Tilinin, I. S., Jablonski, A., Tougaard, S.Volume:
25
Language:
english
Pages:
13
Journal:
Surface and Interface Analysis
DOI:
10.1002/(sici)1096-9918(199702)25:23.0.co;2-y
Date:
February, 1997
File:
PDF, 704 KB
english, 1997