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Characterization of Quaternary Metal Oxide Films by Synchrotron X-ray Fluorescence Microprobe
Perry, D. L., Thompson, A. C., Russo, R. E., Mao, X. L., Chapman, K. L.Volume:
51
Year:
1997
Language:
english
Pages:
3
Journal:
as/51/12/as-51-12-1781.pdf
DOI:
10.1366/0003702971939749
File:
PDF, 142 KB
english, 1997