Simple Transient Extension Chamber to Permit Full Mass...

Simple Transient Extension Chamber to Permit Full Mass Scans with Electrothermal Vaporization Inductively Coupled Plasma Mass Spectrometry

Langer, Delony, Holcombe, James A.
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Volume:
53
Year:
1999
Language:
english
Pages:
7
Journal:
as/53/10/as-53-10-1244.pdf
DOI:
10.1366/0003702991945489
File:
PDF, 219 KB
english, 1999
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