Characterization of Dendrimers by X-ray Photoelectron...

Applied Spectroscopy 1999 Vol. 53; Iss. 10

Characterization of Dendrimers by X-ray Photoelectron Spectroscopy

Chehimi, Mohamed M., Lipskier, Jean-Francois, Caminade, Anne-Marie, Majoral, Jean-Pierre, Demathieu, Caroline
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Volume:
53
Year:
1999
Language:
english
Pages:
5
Journal:
as/53/10/as-53-10-1277.pdf
DOI:
10.1366/0003702991945524
File:
PDF, 205 KB
english, 1999
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