FT-IR Microscopic Base Imaging System: Applications for Chemical Analysis of Zn and Ni Atmospheric Corrosion
Lefez, B., Jouen, S., Kasperek, J., Hannoyer, B.Volume:
55
Year:
2001
Language:
english
Pages:
4
Journal:
as/55/7/as-55-7-935.pdf
DOI:
10.1366/0003702011952767
File:
PDF, 332 KB
english, 2001