Molecular Composition and Orientation of Interstitial versus Surface Silicon Oxides for Si(111)/SiO2 and Si(100)/SiO2 Interfaces using FT-IR and X-ray Photoelectron Spectroscopies
Kandilioti, Georgia, Siokou, Angeliki, Papaefthimiou, Vasiliki, Kennou, Stella, Gregoriou, Vasilis G.Volume:
57
Year:
2003
Language:
english
Pages:
8
Journal:
as/57/6/as-57-6-628.pdf
DOI:
10.1366/000370203322005300
File:
PDF, 328 KB
english, 2003