Analysis of Depth Profiling Data Obtained by Confocal Raman Microspectroscopy
Vyörykkä, J., Paaso, J., Tenhunen, M., Tenhunen, J., Iitti, H., Vuorinen, T., Stenius, P.Volume:
57
Year:
2003
Language:
english
Pages:
6
Journal:
as/57/9/as-57-9-1123.pdf
DOI:
10.1366/00037020360695982
File:
PDF, 1.65 MB
english, 2003