Reference Sample Method Reduces the Error Caused by...

Applied Spectroscopy 2004 Vol. 58; Iss. 1

Reference Sample Method Reduces the Error Caused by Variable Cryosection Thickness in Fourier Transform Infrared Imaging

Rieppo, Jarno, Hyttinen, Mika M., Jurvelin, Jukka S., Helminen, Heikki J.
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Volume:
58
Year:
2004
Language:
english
Pages:
4
Journal:
as/58/1/as-58-1-137.pdf
DOI:
10.1366/000370204322729577
File:
PDF, 242 KB
english, 2004
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