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Corroded Surface Roughness of Copper Analyzed by Fourier Transform Infrared Mapping Microscopy and Optical Profilometric Study
Kasperek, J., Lefez, B., Beucher, E.Volume:
58
Year:
2004
Language:
english
Pages:
5
Journal:
as/58/2/as-58-2-179.pdf
DOI:
10.1366/000370204322842904
File:
PDF, 1.42 MB
english, 2004