Infrared Surface Analysis Using a Newly Developed...

Applied Spectroscopy 2009 Vol. 63; Iss. 1

Infrared Surface Analysis Using a Newly Developed Thin-Sample Preparation System

Nagai, Naoto, Nishiyama, Itsuo, Kishima, Yoshio, Iida, Katsuhiko, Mori, Koichi
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Volume:
63
Year:
2009
Language:
english
Pages:
7
Journal:
as/63/1/as-63-1-66.pdf
DOI:
10.1366/000370209787169885
File:
PDF, 1.62 MB
english, 2009
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