Advantages of photon scanning tunneling microscope combined...

Chinese Optics Letters 2005 Vol. 3; Iss. S1

Advantages of photon scanning tunneling microscope combined with atomic force microscope

Jian Zhang, Yinli Li, Gaoshu Jian, Ping Zhou, Shifa Wu
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Volume:
3
Year:
2005
Language:
faroese
Pages:
1
Journal:
col/3/S1/col-3-S1-S313.pdf
DOI:
10.3788/COL200503S1.S313
File:
PDF, 547 KB
faroese, 2005
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