Optical gauge block metrology in KRISS
Chu-Shik Kang, Jae Wan Kim, Jong-Ahn Kim, Ho Suhng Suh, Won-Kyu LeeVolume:
5
Year:
2007
Language:
english
Pages:
1
Journal:
col/5/S1/col-5-S1-S237.pdf
DOI:
10.3788/COL200705S1.S237
File:
PDF, 288 KB
english, 2007