Detection of subsurface defects of fused silica optics by confocal scattering microscopy
Pengfei He, 贺鹏飞, Yiqin Ji, 季一勤, Tian Sang, 桑田, Huasong Liu, 刘华松, Dandan Liu, 刘丹丹, Zhanshan Wang, 王占山, Bin Ma, 马彬, Zhengxiang Shen, 沈正祥Volume:
8
Year:
2010
Language:
english
Pages:
4
Journal:
col/8/3/col-8-3-296.pdf
DOI:
10.3788/COL20100803.0296
File:
PDF, 1.18 MB
english, 2010