Failure mode analysis of oxide VCSELs in high humidity and...

Journal of Lightwave Technology 2003 Vol. 21; Iss. 4

Failure mode analysis of oxide VCSELs in high humidity and high temperature

Suning Xie, Herrick, R.W., Chamberlin, D., Rosner, S.J., McHugo, S., Girolami, G., Mayonte, M., Seongsin Kim, Widjaja, W.
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Volume:
21
Year:
2003
Language:
english
Pages:
7
Journal:
jlt/21/4/jlt-21-4-1013.pdf
DOI:
10.1109/JLT.2003.809546
File:
PDF, 454 KB
english, 2003
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