A Method for Measuring Extremely Small Non-Uniformities in...

Journal of the Optical Society of America 1949 Vol. 39; Iss. 12

A Method for Measuring Extremely Small Non-Uniformities in the Optical Thickness of Evaporated Films

GEE, ALAN E., POLSTER, HARRY D.
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Volume:
39
Year:
1949
Language:
english
Journal:
josa/39/12/josa-39-12-1044.pdf
DOI:
10.1364/JOSA.39.001044
File:
PDF, 477 KB
english, 1949
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