![](/img/cover-not-exists.png)
Scanning image detection (SID) system for conventional transmission electron microscope (CTEM) images
Takayoshi Tanji, Masahiro Tomita, Hiroyuki KobayashiVolume:
15
Year:
1990
Language:
english
Pages:
3
DOI:
10.1002/jemt.1060150409
File:
PDF, 404 KB
english, 1990