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Effects of Sample Cooling on Depth Profiling of Na in SiO2 Thin Films
Vajo, John J.Volume:
25
Language:
english
Pages:
4
Journal:
Surface and Interface Analysis
DOI:
10.1002/(sici)1096-9918(199704)25:43.0.co;2-u
Date:
April, 1997
File:
PDF, 237 KB
english, 1997