Multiple-wavelength ellipsometry in thin uniaxial...

Multiple-wavelength ellipsometry in thin uniaxial nonabsorbing films

Antippa, Adel F., Leblanc, Roger M., Ducharme, Daniel
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Volume:
3
Year:
1986
Language:
english
Journal:
josaa/3/11/josaa-3-11-1794.pdf
DOI:
10.1364/JOSAA.3.001794
File:
PDF, 842 KB
english, 1986
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