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Computation of the field diffracted by a local surface defect: application to tip-sample interaction in the photon scanning tunneling microscope
Weeber, J. C., deFornel, F., Goudonnet, J. P.Volume:
13
Year:
1996
Language:
english
Journal:
josaa/13/5/josaa-13-5-944.pdf
DOI:
10.1364/JOSAA.13.000944
File:
PDF, 506 KB
english, 1996