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Dependence of transverse and longitudinal resolutions on incident Gaussian beam widths in the illumination part of optical scanning microscopy
Chon, Hyung-Su, Park, Gisung, Lee, Sang-Bum, Yoon, Seokchan, Kim, Jaisoon, Lee, Jai-Hyung, An, KyungwonVolume:
24
Year:
2007
Language:
english
Journal:
josaa/24/1/josaa-24-1-60.pdf
DOI:
10.1364/JOSAA.24.000060
File:
PDF, 220 KB
english, 2007