Scanning force microscopy with applications to electric,...

Scanning force microscopy with applications to electric, magnetic, and atomic forces, by Dror Sarid. Oxford University Press, New York, 1994, 263 pp, $49.95

Alwyn Eades
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Volume:
32
Year:
1995
Language:
english
Pages:
1
DOI:
10.1002/jemt.1070320311
File:
PDF, 116 KB
english, 1995
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