A specimen holder for high-resolution low-temperature...

Microscopy Research and Technique 1995 Vol. 32; Iss. 5

A specimen holder for high-resolution low-temperature scanning electron microscopy

Jacob Bastacky, Charles Lee, Tony Freeman, George Weber, Armando Baeza, Ted Hubbins, Ya Chen
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Volume:
32
Year:
1995
Language:
english
Pages:
2
DOI:
10.1002/jemt.1070320509
File:
PDF, 200 KB
english, 1995
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