Defect analysis in crystals using X-ray topography

Defect analysis in crystals using X-ray topography

Balaji Raghothamachar, Govindhan Dhanaraj, Jie Bai, Michael Dudley
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Volume:
69
Year:
2006
Language:
english
Pages:
16
DOI:
10.1002/jemt.20290
File:
PDF, 808 KB
english, 2006
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