![](/img/cover-not-exists.png)
Defect analysis in crystals using X-ray topography
Balaji Raghothamachar, Govindhan Dhanaraj, Jie Bai, Michael DudleyVolume:
69
Year:
2006
Language:
english
Pages:
16
DOI:
10.1002/jemt.20290
File:
PDF, 808 KB
english, 2006