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FRET and colocalization analyzer—A method to validate measurements of sensitized emission FRET acquired by confocal microscopy and available as an ImageJ Plug-in
Muriel Hachet-Haas, Noël Converset, Olivier Marchal, Hans Matthes, Sophie Gioria, Jean-Luc Galzi, Sandra LecatVolume:
69
Year:
2006
Language:
english
Pages:
16
DOI:
10.1002/jemt.20376
File:
PDF, 1.93 MB
english, 2006