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Nanobeam electron diffraction and high resolution imaging analysis of InN films grown on sapphire
Zongwen Liu, Robert J. Kinsey, Steven M. Durbin, Simon P. RingerVolume:
70
Year:
2007
Language:
english
Pages:
6
DOI:
10.1002/jemt.20398
File:
PDF, 415 KB
english, 2007