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Far-infrared ellipsometry using synchrotron radiation
Kircher, J., Henn, R., Cardona, M., Richards, P. L., Williams, G. P.Volume:
14
Year:
1997
Language:
english
Journal:
josab/14/4/josab-14-4-705.pdf
DOI:
10.1364/JOSAB.14.000705
File:
PDF, 282 KB
english, 1997