Analytical description of z-scan on-axis intensity based on the Huygens–Fresnel principle
Samad, Ricardo Elgul, Dias Vieira, Jr., NilsonVolume:
15
Year:
1998
Language:
english
Journal:
josab/15/11/josab-15-11-2742.pdf
DOI:
10.1364/JOSAB.15.002742
File:
PDF, 228 KB
english, 1998