Analytical description of z-scan on-axis intensity based on...

Analytical description of z-scan on-axis intensity based on the Huygens–Fresnel principle

Samad, Ricardo Elgul, Dias Vieira, Jr., Nilson
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Volume:
15
Year:
1998
Language:
english
Journal:
josab/15/11/josab-15-11-2742.pdf
DOI:
10.1364/JOSAB.15.002742
File:
PDF, 228 KB
english, 1998
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