Two-probe electrical measurements in transmission electron...

Microscopy Research and Technique 2009 Vol. 72; Iss. 2

Two-probe electrical measurements in transmission electron microscopes—Behavioral control of tungsten microwires

Pedro M.F.J. Costa, Xiaosheng Fang, Shiliang Wang, Yuehui He, Yoshio Bando, Masanori Mitome, Jin Zou, Han Huang, Dmitri Golberg
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Volume:
72
Year:
2009
Language:
english
Pages:
8
DOI:
10.1002/jemt.20648
File:
PDF, 335 KB
english, 2009
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