Phase-sensitive electric-field-induced second-harmonic...

Phase-sensitive electric-field-induced second-harmonic microscopy of metal-semiconductor junctions

Wu, K., Carriles, R., Downer, M. C.
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Volume:
24
Year:
2007
Language:
english
Journal:
josab/24/10/josab-24-10-2736.pdf
DOI:
10.1364/JOSAB.24.002736
File:
PDF, 454 KB
english, 2007
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