Noncontact evaluation of nondoped InP wafers by terahertz...

Journal of the Optical Society of America B 2009 Vol. 26; Iss. 9

Noncontact evaluation of nondoped InP wafers by terahertz time-domain spectroscopy

Zhang, Caihong, Jin, Biaobing, Chen, Jian, Wu, Peiheng, Tonouchi, Masayoshi
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Volume:
26
Year:
2009
Language:
english
Pages:
1
Journal:
josab/26/9/josab-26-9-A1.pdf
DOI:
10.1364/JOSAB.26.0000A1
File:
PDF, 940 KB
english, 2009
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