X-Ray Emission Spectroscopic Analysis for Crystallized Amorphous Silicon Induced by Excimer Laser Annealing
John, Young-Min, Kim, Dong-Hwan, Cho, Woon-Jo, Lee, Seok, Kurmaev, E.Z.Volume:
5
Year:
2001
Pages:
4
Journal:
josk/5/1/josk-5-1-1.pdf
DOI:
10.3807/JOSK.2001.5.1.001
File:
PDF, 254 KB
2001