Development and Evaluation of an Electron Beam Source for...

Development and Evaluation of an Electron Beam Source for Microscopy and Its Applications

Ahn, Seung-Joon, Oh, Tae-Sik, Kim, Ho-Seob, Ahn, Seong-Joon
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Volume:
14
Year:
2010
Language:
english
Pages:
4
Journal:
josk/14/2/josk-14-2-127.pdf
DOI:
10.3807/JOSK.2010.14.2.127
File:
PDF, 929 KB
english, 2010
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