![](/img/cover-not-exists.png)
Development and Evaluation of an Electron Beam Source for Microscopy and Its Applications
Ahn, Seung-Joon, Oh, Tae-Sik, Kim, Ho-Seob, Ahn, Seong-JoonVolume:
14
Year:
2010
Language:
english
Pages:
4
Journal:
josk/14/2/josk-14-2-127.pdf
DOI:
10.3807/JOSK.2010.14.2.127
File:
PDF, 929 KB
english, 2010