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Photometric study of layers of amorphous silicon carbide
Onokhov, A. P., Fedorov, M. A., Feoktistov, N. A.Volume:
69
Year:
2002
Language:
english
Journal:
jot/69/10/jot-69-10-766.pdf
DOI:
10.1364/JOT.69.000766
File:
PDF, 217 KB
english, 2002