Back-scattered electron imaging for leakage analysis of...

Microscopy Research and Technique 2012 Vol. 75; Iss. 6

Back-scattered electron imaging for leakage analysis of four retrofilling materials

Simone Bücker Chittoni, Tassiana Martini, Márcia Helena Wagner, Ricardo Abreu Da Rosa, Bruno Cavalini Cavenago, Marco Antônio Húngaro Duarte, Celso Afonso Klein Jr, Marcus Vinícius Reis Só
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Volume:
75
Year:
2012
Language:
english
Pages:
1
DOI:
10.1002/jemt.21128
File:
PDF, 941 KB
english, 2012
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