Using features of the spectral responses when monitoring...

Using features of the spectral responses when monitoring the thicknesses of layers during the deposition of multilayer systems

Karasev, N. N., Putilin, É. S.
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Volume:
71
Year:
2004
Language:
english
Journal:
jot/71/10/jot-71-10-709.pdf
DOI:
10.1364/JOT.71.000709
File:
PDF, 123 KB
english, 2004
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