Determining the parameters of optical thin films by a spectrophotometric method
Vol'pyan, O. D., Yakovlev, P. P.Volume:
71
Year:
2004
Language:
english
Journal:
jot/71/12/jot-71-12-847.pdf
DOI:
10.1364/JOT.71.000847
File:
PDF, 39 KB
english, 2004