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Ways to improve the industry-wide system for metrological assurance of infrared optoelectronic devices
Baloev, V. A., Kurt, V. I., Shchipunov, A. N.Volume:
74
Year:
2007
Language:
english
Journal:
jot/74/3/jot-74-3-152.pdf
DOI:
10.1364/JOT.74.000152
File:
PDF, 1.84 MB
english, 2007