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Spontaneous emission lifetime of carriers in a semiconductor microcavity measured by photoluminescence without distortion by reabsorption
Park, S., Zapasskii, V., Wick, D., Nelson, T., Ell, C., Gibbs, H., Khitrova, G., Schulzgen, A., Kira, M., Jahnke, F.Volume:
4
Year:
1999
Language:
english
Journal:
oe/4/13/oe-4-13-512.pdf
DOI:
10.1364/OE.4.000512
File:
PDF, 277 KB
english, 1999